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X-ray photoelectron spectroscopy
Results: 274

#	Item
201	Impedance Based Characterization of Raw Materials Used in Electrochemical Manufacturing by Douglas P. Riemer and Mark E. Orazem M Add to Reading List Source URL: www.electrochem.org Language: English - Date: 2014-08-26 16:39:40 Spectroscopy Electrochemistry Dielectric spectroscopy Physics X-ray photoelectron spectroscopy Stainless steel Capacitor Chemistry Physical chemistry Science
202	www.lightsource.ca Research Report 2012 www.lightsource.ca Phone: ([removed] Add to Reading List Source URL: www.lightsource.ca Language: English - Date: 2014-01-06 15:08:42 Spectroscopy XANES Graphene Carbon nanotube Graphite oxide Fluorescence Absorption spectroscopy X-ray absorption spectroscopy X-ray photoelectron spectroscopy Chemistry Science Physics
203	Microsoft Word - VSGC-XPSpaper2006.doc Add to Reading List Source URL: vsgc.odu.edu Language: English - Date: 2012-02-03 12:13:18 Spectroscopy Atomic physics Molecular physics Surface chemistry X-ray photoelectron spectroscopy Electron microscopy Photoemission spectroscopy Electron X-ray Physics Chemistry Science
204	Seokmin Jeon Postdoctoral Researcher Imaging and Nanoscale Characterization Group Center for Nanophase Materials Sciences Oak Ridge National Laboratory[removed] Add to Reading List Source URL: cnms.ornl.gov Language: English - Date: 2014-08-12 09:40:01 Ultra-high vacuum Vacuum X-ray photoelectron spectroscopy Surface science Organic semiconductor Photoemission spectroscopy Characterization Spectroscopy Pohang University of Science and Technology Chemistry Physics Science
205	Selected Area XPS Analysis for Identification of Pigment Compounds in Microscopic Paint Flakes Add to Reading List Source URL: downloads.hindawi.com Language: English - Date: 2014-08-28 23:30:45 Spectroscopy X-ray photoelectron spectroscopy Raman spectroscopy X-ray fluorescence Photoemission spectroscopy Chemical state Energy-dispersive X-ray spectroscopy Fourier transform infrared spectroscopy Applied spectroscopy Scientific method Science Chemistry
206	Chapter 9 Spectral Fitting in HXDS Detector Data Analysis Add to Reading List Source URL: cxc.harvard.edu Language: English - Date: 2011-02-17 16:30:16 Scientific method Null X-ray photoelectron spectroscopy Statistical hypothesis testing Spectral line Monochromator X-ray Spectroscopy Science Chemistry
207	3.2. Apertures Chapter Characteristic Focal plane Add to Reading List Source URL: cxc.harvard.edu Language: English - Date: 2011-02-17 16:30:00 Science of photography Spectroscopy Atomic physics Molecular physics Antenna aperture BESSY X-ray photoelectron spectroscopy Telescope F-number Optics Physics Science
208	9.2. Reduction of the Line Measurements Chapter 9 Add to Reading List Source URL: cxc.harvard.edu Language: English - Date: 2011-02-17 16:30:17 Scientific method Null Monochromator X-ray photoelectron spectroscopy Spectral line Statistical hypothesis testing X-ray Spectroscopy Science Chemistry
209	Chapter 15 Wing Scans: Analysis Terrance J. Gaetz Add to Reading List Source URL: cxc.harvard.edu Language: English - Date: 2011-02-17 16:31:12 Spectroscopy Atomic physics Molecular physics Cameras Pinhole camera model X-ray photoelectron spectroscopy Optics Light-emitting diode Science Physics Chemistry
210	Microsoft Word - Probe Justification.docx Add to Reading List Source URL: www.probesoftware.com Language: English - Date: 2013-09-24 02:19:24 Spectroscopy Analytical chemistry Measuring instruments X-rays Atomic physics Electron microprobe Data analysis X-ray photoelectron spectroscopy Test probe Science Chemistry Scientific method

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